In the Penryn processors that we recently began
fabricating, most of their transistors' features measure
around 45 nm, though one is as small as 35 nm. It's the
first commercial microprocessor to have features this
small; all other top-of-the-line microprocessors in
production as this article is being written have 65-nm
features. In other words, Penryn is the first of the
45-nm generation of microprocessors. Many more will soon follow.
The thickness of the SiO2
insulation on the transistor's gate has scaled from
about 100 nm down to 1.2 nm on state-of-the-art
microprocessors. The rate at which the thickness
decreased was steady for years but started to slow at
the 90-nm generation, which went into production in
2003. It was then that the oxide hit its five-atom
limit. The insulator thickness shrank no further from
the 90-nm to the 65-nm generation still common today.
The reason the gate oxide was shrunk no further is
that it began to leak current [see illustration,
“”]. This leakage arises from quantum
effects. At 1.2 nm, the quantum nature of particles
starts to play a big role. We're used to thinking of
electrons in terms of classical physics, and we like to
imagine an electron as a ball and the insulation as a
tall and narrow hill. The height of the hill represents
how much energy you'd need to provide the electron to
get it to the other side. Give it a sufficient push
and—sure enough—you could get it over the hill,
busting through the insulation in the process.
But when the hill (the oxide layer) is so narrow that
you are counting individual atoms of thickness, the
electron looks less like a ball and more like a wave.
Specifically, it's a wave that defines the probability
of finding the electron in a particular location. The
trouble is that the wave is actually broader than the
hill, extending all the way to the other side and
beyond. That means there is a distinct probability that
an electron that should be on the gate side of the oxide
can simply appear on the channel side, having “tunneled”
through the energy barrier posed by the insulation
rather than going over it.
In the mid-1990s, we at
Intel and other major chip makers recognized
that we were fast approaching the day when we would no
longer be able to keep squeezing atoms out of the
SiO2 gate insulator. So we all
launched research programs to come up with a better
solution. The goal was to identify a gate dielectric
material as a replacement for
SiO2 and also to demonstrate
transistor prototypes that leaked less while at the same
time driving plenty of current across the transistor
channel. We needed a gate insulator that was thick
enough to keep electrons from tunneling through it and
yet permeable enough to let the gate's electric field
into the channel so that it could turn on the
transistor. In other words, the material had to be
physically thick but electrically thin.
The technical term for such a material is a
“high-k” dielectric;
k, the
dielectric constant, is a term that refers to a
material's ability to concentrate an electric field.
Having a higher dielectric constant means the insulator
can provide increased capacitance between two conducting
plates—storing more charge—for the same thickness of
insulator. Or if you prefer, it can provide the same
capacitance with a thicker insulator [see illustration,
“”]. SiO2
typically has a k of around 4, while
air and a vacuum have values of about 1. The k-value is related to
how much a material can be polarized. When placed in an
electric field, the charges in a dielectric's atoms or
molecules will reorient themselves in the direction of
the field. These internal charges are more responsive in
high-k
dielectrics than in low-k ones.
Incidentally, back in 2000, leading semiconductor
firms began to change the material used to insulate the
metal wires that connect transistors to each other from
SiO2 to low-k dielectrics. In the
case of interconnects, you do not want the electric
field from one wire to be felt in other nearby wires,
because it creates a capacitor between the wires and can
interfere with or slow down the signals on them. A
low-k
dielectric prevents the problem.